# David E. Aspnes

> David Erik Aspnes is an American physicist and a member of the National Academy of Sciences (1998). Aspnes developed fundamental theories of the linear and nonlinear optical properties of materials and thin films, and the technology of spectroscopic ellipsometry (SE). SE is a metrology that is used in the manufacture of integrated circuits.

*American physicist*

**Canonical URL:** https://fame.am/person/david-e-aspnes

## Identity
- **Profile type:** Scientist ([Wikidata](https://www.wikidata.org/entity/Q39631))
- **Category:** Scientists
- **Country:** United States
- **Born:** 1939-05-01
- **Status:** living
- **Gender:** male

## Bio

Imported from discovery source: wikidata-dump

## Fame
- **Popularity score:** 36.2 / 100
- **Momentum:** 0.0 / 100  (trend: FALLING)
- **Historical depth:** 5.3 / 100
- **Now attention:** 0.0 / 100
- **Source confidence:** 35.0 / 100
- **Profile completeness:** 70.0 / 100

## Sources
- [David Aspnes](https://de.wikipedia.org/wiki/David_Aspnes)
- [ديڤيد اى. اسپنيس](https://arz.wikipedia.org/wiki/%D8%AF%D9%8A%DA%A4%D9%8A%D8%AF_%D8%A7%D9%89._%D8%A7%D8%B3%D9%BE%D9%86%D9%8A%D8%B3)
- [دیوید ای. اسپنس](https://azb.wikipedia.org/wiki/%D8%AF%DB%8C%D9%88%DB%8C%D8%AF_%D8%A7%DB%8C._%D8%A7%D8%B3%D9%BE%D9%86%D8%B3)
- [David E. Aspnes](https://mg.wikipedia.org/wiki/David_E._Aspnes)
- [David E. Aspnes](https://en.wikipedia.org/wiki/David_E._Aspnes)
- [دیوید ای. اسپنس](https://fa.wikipedia.org/wiki/%D8%AF%DB%8C%D9%88%DB%8C%D8%AF_%D8%A7%DB%8C._%D8%A7%D8%B3%D9%BE%D9%86%D8%B3)
- [Wikidata](https://www.wikidata.org/wiki/Q43392)

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